Efficient Test Application for Core-Based Systems Using Twisted-Ring Counters
نویسندگان
چکیده
منابع مشابه
On Using Twisted-Ring Counters for Test Set Embedding in BIST
We present a novel built-in self-test (BIST) architecture for high-performance circuits. The proposed approach is especially suitable for embedding precomputed test sets for core-based systems since it does not require a structural model of the circuit, either for fault simulation or for test generation. It utilizes a twisted-ring counter (TRC) for test-per-clock BIST and is appropriate for hig...
متن کاملImplementation of BIST Test Generation Scheme based on Single and Programmable Twisted Ring Counters
Twisted-ring-counters (TRCs) have been used as built-in test pattern generators for highperformance circuits due to their small area overhead and simple control circuitry. When compared to other pattern generators TRC often requires long test time to achieve high fault coverage and large storage space to store required control data and TRC seeds. Programmable Twisted Ring Counter-based on-chip ...
متن کاملa new type-ii fuzzy logic based controller for non-linear dynamical systems with application to 3-psp parallel robot
abstract type-ii fuzzy logic has shown its superiority over traditional fuzzy logic when dealing with uncertainty. type-ii fuzzy logic controllers are however newer and more promising approaches that have been recently applied to various fields due to their significant contribution especially when the noise (as an important instance of uncertainty) emerges. during the design of type- i fuz...
15 صفحه اولBuilt-in self testing of high-performance circuits using twisted-ring counters
We present an enhanced built-in self-test (BIST) architecture for high-performance circuits. Test patterns are generated by reseeding a twisted-ring counter. We show that a small number of seeds is adequate for generating test sequences that embed complete test sets for the ISCAS benchmark circuits. The seed patterns can either be stored on-chip or scanned in using a low-cost, slower tester. Th...
متن کاملapplication of upfc based on svpwm for power quality improvement
در سالهای اخیر،اختلالات کیفیت توان مهمترین موضوع می باشد که محققان زیادی را برای پیدا کردن راه حلی برای حل آن علاقه مند ساخته است.امروزه کیفیت توان در سیستم قدرت برای مراکز صنعتی،تجاری وکاربردهای بیمارستانی مسئله مهمی می باشد.مشکل ولتاژمثل شرایط افت ولتاژواضافه جریان ناشی از اتصال کوتاه مدار یا وقوع خطا در سیستم بیشتر مورد توجه می باشد. برای مطالعه افت ولتاژ واضافه جریان،محققان زیادی کار کرده ...
15 صفحه اولذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: VLSI Design
سال: 2001
ISSN: 1065-514X,1563-5171
DOI: 10.1155/2001/75139